Typical Applications
à Laser/Diode Laser characterization
à Laser assembly development, alignment, characterization, production test & QA.
à Lasers And Laser Assemblies for
- Disk/Wafer Characterization
- Laser Printing/Marking
- Medical Lasers
- Bar Code Scanners … etc.
Real Time:
à X-Y Profile Measurement
à Angular Divergence
à Ellipticity, Centroid, Gaussian fit
à Relative Power
Features:
à Beam dimensions 100 mm to 45 mm
à Resolution 2 mm or 0.5 %
à 190 nm to 3.5 mm options
à M2 measurement accessory
à ISO 11146 Compliant
à Narrow probe for confined spaces
à Front mounted apertures
à Wide dynamic range
à Powerful, intuitive software
à Upgrade option, BeamScope-P7 to USB 2.0
Accessories & Options
à M2 Measurement Accessory-USB 2.0
à UV - NIR Options 190 to 3.5 µm
à 2-D Scan Stage for 23 x 45 mm profiling
BeamScope-P8 system is comprised of: a compact head, interface box, a 3 m (10 ft.) USB 2.0 cable, user manual, and Software for Windows XP, Vista or Windows7. (Windows and Vista are registered trademarks of Microsoft Corp.)
Principle of Operation: A linear scanning probe carries either a single pinhole, a single slit, or orthogonal X-Y slits. This linear scan satisfies the strict requirements of the ISO 11146 laser profiling standard*. Light passing through the slits falls onto a Silicon (190 to 1150 nm) or Germanium (800 to 1800 nm) detector. [* Until the introduction of the DataRay BeamScope Beam Profiler, no commercially available slit scan or knife-edge scan beam profiler met the ISO 11146 Standard. The Standard requires that the scan be performed in a plane orthogonal to the propagation axis. Drum style scanners cannot meet the Standard. DataRay’s unique linear scan probe is designed to fully comply with the Standard.]
Acquire Beam Profiles In Constricted Areas
BeamScope-P8 has made the measurement of once inaccessible beam profiles not merely possible, but simple. The unique probestyle scan head easily peers into confined axial gaps between lens, mirrors, and filters. Its ability to probe along-axis spaces as narrow as 12mm creates a whole new world of applications.
No Beam Distortion From Optics Or Filters
There's no distortion of the beam due to ancillary optics or filters because the BeamScope-P8 doesn't need them when analyzing most type of lasers. The AUTO GAIN feature can continually adjust the detector amplifier gain to ensure full use of the 55 dB (300,000:1) gain range. Spot dimensions from 3 mm to 23 mm can be measured from a single scan head. Scan beam areas up to 23 x 45 mm with the new 2-D stage accessory.
Front Mounted Apertures
Front mounted apertures enable you to see precisely where the beam is being measured. Rapidly diverging and fast focusing beams are simple to capture if you can get close to your source. Now it's easier than ever to measure laser diode arrays, micro-lensed sources, broad stripe lasers, etc. Available apertures can accommodate power densities up to 100 W/mm2 onto small pinhole apertures. (Max. Total power = 0.5 W) Change apertures in minutes from slits to pinholes. This makes the BeamScope-P8 an unbeatable value in beam analyzers.
Notebook PC Portability with USB 2.0
BeamScope plugs interface to a USB 2.0 port on your notebook PC to give a portable unit with a small footprint.
Perfect For R&D, QA & Production
R&D users will appreciate the comprehensive range of analytical functions. QA & Production engineers will appreciate the ability to save test configurations as JOB files, and to indicate Pass/Fail onscreen.
Unparalleled M2 Measurements
The BeamScopeTM P8 optional M2DU-P8 accessory is unlike any other on the market. There are no complicated adjustments, yet the user can achieve highly repeatable measurements. The software automatically takes more frequent measurements in the waist area in order to accurately determine the true waist diameter.
23 x 45 mm 2-D Scan Stage
DataRay’s latest beam profiling innovation offers extraordinary 0.2% (512 x 512 pixels) resolution, down to 5 x 5 mm (HxV), over beam areas up to 23 x 45 mm. 2-D scan results display in the integral imaging software for area image analysis.
Notes:
1. The 2-D and 3-D profiles are ‘reconstructed’ from the X-Y scan, making the assumption that the measured X beam profile is the same for all values of Y, and that the measured Y beam profile is the same for all values of X.
2. In Single Slit or Pinhole mode, the slit/pinhole width should be £1/3rd of the diameter of the beam under measurement. For X-Y slit pairs inclined at ±45o , the ratio is approximately 1/5th.
3. In Knife-Edge mode, the slit width should be ³ 3x the beam diameter. For X-Y slit pairs inclined at ±45o , the ratio is ³4.3 times the beam diameter.
Power Limit. The graph allows you to simply determine the approximate maximum optical power that BeamScope can measure without additional attenuation. The limit is a detector current limit.
PxS is the Power Limit in Watts.
To calculate the power limit at the laser wavelength:
The graph shows the approximate saturation beam power in mW versus wavelength for a 100 μm diameter beam (1/e2 ) & a 5 μm slit.
1) Determine the plotted value, PS mW, for your wavelength. (e.g. 70 mw at 633 nm)
2) For a different slit or beam, multiply PS by: 0.05.(beam diam., µm)/(slit width, µm)
3) For a pinhole multiply PS by: 0.05 x (beam diam., µm)2 /(pinhole diam. µm)2