Interference and diffraction patterns from laser light passing through various single-slits and multiple-slits are scanned and plotted in real-time. These patterns are then examined for similarities and differences.
The distances between the central maximum and the diffraction minima for a single slit are measured by scanning the laser pattern with a Light Sensor and plotting light intensity versus distance. Also, the distances between interference maxima for 2 or more slits are measured. These measurements are compared to theoretical values. Differences and similarities between interference and diffraction patterns are examined.
PASCO Advantage:
Since the Linear Translator tracks the position of the Light Sensor, it is not necessary to move the Light Sensor at a constant speed. The intensity versus distance graph is plotted in real-time, showing the connection between the intensity pattern and the actual laser pattern.
Includes
- CI-6504A Light Sensor
- CI-6538 Rotary Motion Sensor
- OS-8508 1.2 m Optics Track -- Basic Optics
- OS-8523 Slit Accessories – Basic Optics
- OS-8525A Diode Laser -- Basic Optics
- OS-8534A Aperture Bracket
- OS-8535 Linear Translator -- Basic Optics
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